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Characterization and ultrafast control of SOI waveguide elements employing localized optical pumping

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Abstract

Ultraviolet pump pulses generate a complex refractive index change in silicon, which we utilize for characterization and all-optical ultrafast control of waveguide elements. We demonstrate this versatile and damage-free technique on multimode interference devices.

© 2014 Optical Society of America

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All-optical ultrafast control of SOI waveguide elements employing localized absorption

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