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Optimization of antireflection coatings using a linear graded porous silicon film in crystalline silicon solar cells

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Optimizing the antireflection coatings of porous silicon (PS ARC) is found to be sensitive to their thicknesses. The optimal reflectance for a 400-nm-thin, PS ARC is calculated to be as low as 1.55%.

© 2012 Optical Society of America

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