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Direct Characterization of Axial p-n Junctions for InP Nanowire Array Solar Cells Using Electron Beam-Induced Current

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Abstract

Electron beam-induced current (EBIC) technique combined with simulations were used to study the axial p-n junctions of InP nanowire array solar cells. Photovoltaic devices have also been fabricated and characterized to confirm the EBIC results.

© 2015 Optical Society of America

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