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  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • OSA Technical Digest (CD) (Optica Publishing Group, 2007),
  • paper JThD96

Photonic force microscopy with back-scattered light

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Abstract

We compare the sensitivity of the Photonic Force Microscope for the forward-scattering and backwardscattering geometries, calculating the total-scattered electromagnetic field from a dielectric bead in an optical trap using a Mie-Debye approach.

© 2007 Optical Society of America

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