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Schlieren Nanoscope in Atom Optics

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Abstract

One proposes the equivalent of Schlieren photography in atom interferometry. It is based on van der Waals inelastic diffraction by a material surface, in which the atom internal state (i.e., Zeeman sublevel) is modified by the surface interaction. Inelastic diffraction by two close wires, or the two surfaces of a slit, leads to non-localised atom interferences, the amplitude of which is sensitive to van der Waals interactions in the nanometer range. Implementation of this atom nanoscope on cooled metastable Ar* beam will be presented.

© 2007 Optical Society of America

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