Abstract
We are developing optical techniques for ultra-high-resolution position measurement and localization of moving atoms,1,2 These techniques may find important applications in the measurement of sub-Optical-wavelength atomic interference patterns and in experiments with localized wave packets in atomic beams. The techniques, which are based on Raman-induced resonance imaging, employ level-shifting potentials that vary along, one spatial axis K perpendicular to the atomic beam propagation direction. This makes the atomic resonance frequency position dependent. Two optical fields that are off resonant with an intermediate excited state are used to induce Raman transitions between two long-lived ground states.
© 1991 Optical Society of America
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