Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Quantum Electronics and Laser Science Conference
  • OSA Technical Digest (Optica Publishing Group, 1996),
  • paper QFF1

UV-photoinduced charge trapping at the Si-SiO2 interface observed with second harmonic generation

Not Accessible

Your library or personal account may give you access

Abstract

The Si-SiO2 interface is the most important interface in high technology. As a buried interface it has been extensively investigated with use of the noninvasive, surface specific tool of second harmonic (SH) generation. Previously1 we have shown that in single beam experiments employing a 100 fs, 76 MHz, 770-nm source, the SH signal increased by a factor of up to 5 on a 10 s time scale for a silicon wafer with native oxide. We suggested that this was due to enhancement of the interfacial nonlinear susceptibility by a DC electric field resulting from electron excitation and trapping following absorption of <105 third harmonic photons (257 nm) generated by the incident beam. Here we provide confirmation of this interpretation of the time-dependent SH signal and have used an independent UV beam to provide insight into details of electron trapping processes.

© 1996 Optical Society of America

PDF Article
More Like This
Optical second harmonic generation probing of electron trapping in SiO2 on silicon

JG Mihaychuk, J Bloch, and HM van Driel
WL30 International Quantum Electronics Conference (IQEC) 1996

Broadband Surface Second Harmonic Generation from Si/SiO2 Interfaces

S.T. Cundiff, W.H Knox, F.H. Baumann, P.K. Roy, and H.M. van Driel
FE.44 International Conference on Ultrafast Phenomena (UP) 1996

Dependence of optical second harmonic generation on electric field and strain at SiO2/Si(001) and Si3N4/Si(001) interfaces

J. I. Dadap, X.F. Hu, M.H. Anderson, M.C. Downer, J.K. Lowell, and O.A. Aktsipetrov
FD3 International Quantum Electronics Conference (IQEC) 1996

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved