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Optica Publishing Group
  • Quantum Electronics and Laser Science Conference
  • OSA Technical Digest (Optica Publishing Group, 1997),
  • paper QWC4

Characterization of anodic oxide growth kinetics on (100) Si by surface second-harmonic generation

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Abstract

Anodic oxidation is a simple technique for producing Si02 films on Si at room temperature,1 which also has unique applications for dopant delineation2 and dopant depth profiling.3 Because of the inaccessability of the Si/SiO2/electrolyte interfaces, optical secondharmonic (SH) generation is one of the few techniques capable of monitoring anodic oxidation in situ and in real time.4

© 1997 Optical Society of America

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