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Optica Publishing Group
  • Quantum Electronics and Laser Science Conference
  • OSA Technical Digest (Optica Publishing Group, 1999),
  • paper QThB7

High-order nonlinear interferometry at Si(110) buried interface

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Abstract

Second-harmonic based nonlinear-optical interferometry is a technique to measure a phase of nonlinear susceptibility in addition to its absolute value that can be obtained from the SHG intensity measurements. Phase information is important particularly in the vicinity of electron transition. In this case the phase of nonlinear susceptibility can take the value in the range of 0÷2π changing the phase relations between SH fields generated by different sources, and therefore the total SHG signal. Even in the range of transparency the sign of the susceptibility that is measured by the SHG interferometry is important in case of several nonlinear sources contributing to the SHG signal.1 So far however, only second order interferometry has been applied for studying the phase of second-order susceptibility,2 although the same problem of determination the phase is important for higher-order susceptibilities.

© 1999 Optical Society of America

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