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It has been shown1 that the modification undergone by the image given by a Young two-slit object in a 4-f system, in presence of a nonlinear medium, can be used to measure the nonlinear refractive index n2 in various materials. In ref. 1, experimental and theoretical descriptions are reported in detail. Here, we give a brief summary of this method, the so-called Zernicke Imaging Technique (ZIT).
© 1999 Optical Society of America
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