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Although the response of materials to uniaxial shock compression has been a field of study for more than a century, our understanding at the lattice level of the response of crystals to rapid loading is still far from complete. Whilst constitutive models are useful, a full description of phenomena such as shock induced elastic-plastic flow and polymorphic phase transitions requires a knowledge of the atomic positions and the history of their rearrangement during the passage of the shock wave. In principle one of the most direct methods of obtaining such information is the technique of in situ time-resolved X-ray diffraction (TXRD).
© 2002 Optical Society of America
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