Near-field Raman Spectroscopy Using a Sharp Metal Tip

Achim Hartschuh; Lukas Novotny

Quantum Electronics and Laser Science Conference
OSA Technical Digest (Optica Publishing Group, 2002),
paper QMJ4

Near-field Raman Spectroscopy Using a Sharp Metal Tip

Achim Hartschuh and Lukas Novotny

Quantum Electronics and Laser Science Conference 2002

Long Beach, California United States
19–22 May 2002
ISBN: 1-55752-708-3

From the session
Apertures and Near-Field Optics (QMJ)

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A. Hartschuh and L. Novotny, "Near-field Raman Spectroscopy Using a Sharp Metal Tip," in Quantum Electronics and Laser Science Conference, H. Gibbs, D. Wineland, D. Gammon, and D. Heinzen, eds., OSA Technical Digest (Optica Publishing Group, 2002), paper QMJ4.

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Abstract

Combined with near-field techniques, Raman spectroscopy is a promising tool for identifying and analyzing the molecular composition of complex materials, providing spatially resolved chemical maps with nanoscale resolution. Basic drawback of Raman methodes is the comparatively low scattering cross-section precluding the detection of single scatterers.

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