Abstract
We describe the picosecond time-resolved measurement of the x-ray absorption fine structure in laser-melted Si by using a femtosecond laser-produced-plasma soft x-ray source and report that the Si-Si atomic distance broadened due to the melting.
© 2005 Optical Society of America
PDF ArticleMore Like This
Enikő Seres and Christian Spielmann
WB9 Advanced Solid-State Photonics (ASSL) 2005
Ralph Jimenez, Christoph Rose-Petruck, Ting Guo, Jeff Squier, Barry Walker, Kent R. Wilson, and C. P. J. Barty
JTuA5 Conference on Lasers and Electro-Optics (CLEO:S&I) 1998
Cs. T th, A. Cavelleri, C. W. Siders, J. A. Squier, P. Forget, F. Dorchies, and J.-C. Kieffer
CME2 Conference on Lasers and Electro-Optics (CLEO:S&I) 2001