Probing Nano-Structures using Rayleigh Scattering with Supercontinuum Radiation

Feng Wang; Matthew Y. Sfeir; Limin Huang; Jaehee Kim; Chia-Chin Chuang; James C. Hone; Stephen P. O’Brien; Louis E. Brus; Tony Heinz

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies
Technical Digest (CD) (Optica Publishing Group, 2005),
paper QTuK2

Probing Nano-Structures using Rayleigh Scattering with Supercontinuum Radiation

Feng Wang, Matthew Y. Sfeir, Limin Huang, Jaehee Kim, Chia-Chin Chuang, James C. Hone, Stephen P. O’Brien, Louis E. Brus, and Tony Heinz

Quantum Electronics and Laser Science Conference 2005

Baltimore, Maryland United States
22–27 May 2005
ISBN: 1-55752-770-9

From the session
Nanoimaging and Spectroscopy (QTuK)

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F. Wang, M. Y. Sfeir, L. Huang, J. Kim, C. Chuang, J. C. Hone, S. P. O’Brien, L. E. Brus, and T. Heinz, "Probing Nano-Structures using Rayleigh Scattering with Supercontinuum Radiation," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optica Publishing Group, 2005), paper QTuK2.

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Abstract

Rayleigh scattering using high-brightness sources provides a sensitive and general tool to probe the electronic properties of nano-sized structures. This capability is demonstrated by recording the electronic transitions of individual single-wall carbon nanotubes.

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