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Conferences > QELS > 2008 > JThA > JThA15
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • OSA Technical Digest (CD) (Optica Publishing Group, 2008),
  • paper JThA15

Catastrophic Optical Damage in High-Power Diode Lasers Monitored by Real-Time Imaging

Mathias Ziegler, Jens W. Tomm, Thomas Elsaesser, Clemens Matthiesen, Marwan Bou Sanayeh, and Peter Brick

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Abstract

Combined thermal and near field imaging monitors the catastrophic optical damage dynamics in diode lasers. Red emitting high power lasers display a very rapid and spatially confined catastrophic process with re absorption as the key mechanism of device degradation.

© 2008 Optical Society of America

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