Optical Forces in Scanning Probe Microscopy

Dana C. Kohlgraf-Owens; Sergey Sukhov; Aristide Dogariu

doi:10.1364/QELS.2011.QThL4

CLEO:2011 - Laser Applications to Photonic Applications
OSA Technical Digest (CD) (Optica Publishing Group, 2011),
paper QThL4
•https://doi.org/10.1364/QELS.2011.QThL4

Optical Forces in Scanning Probe Microscopy

Dana C. Kohlgraf-Owens, Sergey Sukhov, and Aristide Dogariu

Quantum Electronics and Laser Science Conference 2011

Baltimore, Maryland United States
1–6 May 2011
ISBN: 978-1-55752-910-7

From the session
Positioning, Coupling and Focusing in Nanophotonic Systems (QThL)

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D. C. Kohlgraf-Owens, S. Sukhov, and A. Dogariu, "Optical Forces in Scanning Probe Microscopy," in CLEO:2011 - Laser Applications to Photonic Applications, OSA Technical Digest (CD) (Optica Publishing Group, 2011), paper QThL4.

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Abstract

We demonstrate that the mechanical action of light can be detected by a scanning probe microscope. The conservative and nonconservative electromagnetic forces can be directly measured and they affect the perceived topography.

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