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Ultrafast Tr-ARPES with Artemis XUV Beamline

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Abstract

Two techniques of tremendous importance for understanding complex materials with strong correlations are ultrafast pump-probe spectroscopy, which uses femtosecond laser pulses to study transient phases and relaxation dynamics after photoexcitation [1]; and angle resolved photoemission spectroscopy (ARPES), which retrieves information on electronic band structure and Fermi surface topology by measuring photoelectrons generated by XUV or soft X-ray irradiation [2]. Recently the combination of these techniques using an ultrafast pulse to photoexcite a material, while monitoring the resulting changes using ARPES with a laser-based UV source has directly revealed the evolution in electronic structure during an ultrafast photoinduced phase transition [3].

© 2012 Optical Society of America

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