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Ultrasensitive measurement of MEMS cantilever displacement below the photon shot noise limit

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Abstract

Microcantilever displacement measurements below the backaction noise level are well established, but sensitivity below the shot-noise-limit has remained elusive. We demonstrate sub-shot-noise sensitivity in microcantilever sensing applications using simple differential measurements with multi-spatial-mode squeezed light.

© 2014 Optical Society of America

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