Abstract
In this paper we propose a fidelity induced metric to capture global nonlocal effect of a quantum state due to the locally invariant projective measurements, which is termed as measurement induced nonlocality (MIN). This quantity can be remedying local ancilla problem in the original definition of MIN. We present an analytical formula of fidelity based MIN for an arbitrary pure state and 2×n dimensional mixed state.
© 2017 Optical Society of America
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