Characterizing large-scale quantum devices

Joel J. Wallman; Joel J. Wallman; Joseph Emerson; Joseph Emerson

doi:10.1364/QIM.2019.S3B.2

Quantum Information and Measurement (QIM) V: Quantum Technologies
OSA Technical Digest (Optica Publishing Group, 2019),
paper S3B.2
•https://doi.org/10.1364/QIM.2019.S3B.2

Characterizing large-scale quantum devices

Joel J. Wallman and Joseph Emerson

Quantum Information and Measurement 2019

Rome Italy
4–6 April 2019
ISBN: 978-1-943580-56-9

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Quantum Information III (S3B)

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J. J. Wallman and J. Emerson, "Characterizing large-scale quantum devices," in Quantum Information and Measurement (QIM) V: Quantum Technologies, OSA Technical Digest (Optica Publishing Group, 2019), paper S3B.2.

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Abstract

Characterizing large-scale quantum devices is challenging because quantum noise processes are complex. We present a method for efficiently characterizing general operations in quantum devices with signal-to-noise ratios independent of the system size.

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