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Measurement of modulation saturation intensity in strain-balanced, undefected InGaAs/GaAsP modulators operating at 1.064 μm

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Abstract

The Nd:YAG laser has been considered as a possible light source for optical computing systems based on p-i(MQW)-n modulators, because of its ability to provide high power with high spectral and spatial quality. However, since this laser operates at 1.064 μm, the GaAs/AlGaAs material system cannot be used. Since the GaAs substrate is a better candidate for large-scale integration than InP, much attention has been focused on InGaAs/GaAs MQWs for this application.1-4 However, since the MQW must be at least 1 μm thick for useful surface-normal modulation, strain-relief is bound to occur in this system. This relaxation of the lattice results in dislocations which propagate upward resulting in a striated surface,3 causing diffraction of the light beams. In addition, the defects make the integration of GaAs transistors problematic.

© 1993 Optical Society of America

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