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Robust High-Fidelity Two-Qubit Gates Using Pulsed Dynamical Decoupling

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Abstract

We experimentally characterize a two-qubit phase gate on radio frequency driven trapped-ion qubits generated by applying pulsed dynamical decoupling to each qubit’s carrier resonance. Robustness to pulse errors and ion temperature is shown.

© 2020 The Author(s)

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