Abstract

Plane wave holography is a method of producing and detecting weak spectral holes with very low background [1]. Its success relies upon hole-burning materials of excellent optical quality with strongly absorbing zero phonon lines such as dye doped polymers which have been extensively studied [2 and references therein]. Through an extension of this technique, image storage [3] and data manipulation [4] have been demonstrated in such materials. Here, we report the application of plane wave holography to a crystalline material, Y₂SiO₅:Pr³⁺, for the first time. Spectroscopic measurements of Y₂SiO₅:Pr³⁺ have not previously been reported.

© 1992 Optical Society of America