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Mask Testing of 28 Gbaud 16-QAM Transmitters using Time-Resolved Error Vector Magnitude

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Abstract

We propose time-resolved EVM for characterization of 16-QAM transmitters. By designing a mask test, different impairments can be separated and quantified. The impact from quadrature error and timing skew are investigated experimentally.

© 2015 Optical Society of America

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