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We applied a scanning tunneling microscope (STM) to optoelectronic sampling measurement of high-speed electrical waveform[1]. An optical pulse train was used to turn on and off a photoconductive semiconductor switch (PCSS) made of low temperature GaAs on the STM probe. This special STM can be called scanning tunneling optoelectronic microscope (STOEM).
© 1995 Optical Society of America
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