Abstract
The measurement of short optical and electrical pulses is at the heart of ultrafast optoelectronics. In recent years, complete characterization of short optical pulses has been made possible through the development of frequency-resolved optical gating (FROG) and related techniques. Techniques for measuring picosecond electrical transients via ultrafast sampling using either mode-locked lasers or nonlinear transmission lines have also become widely available over the past decade or so.
© 1997 Optical Society of America
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