Abstract
This communication describes an interferometric and a polarimetric ultrafast electro-optic imager, each capable of imaging the voltage distribution over a rectangular region of an (opto)electronic device. The detector is a commercial 2-dimensional (2-D) charge-coupled-device (CCD) array having a limited dynamic range. Our analysis focuses on techniques that take advantage of the speed and convenience of a CCD measurement system and overcome the dynamic-range limitations of CCD’s. Experimental results obtained with a non-optimized polarimeter having a voltage sensitivity of −1.8 V are presented. Theoretical voltage sensitivity for an interferometric system is 270 mV.
© 1997 Optical Society of America
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