Abstract

The development of very-high-speed electronic and opto-elelctronic systems requires instrumentation to routinely characterize very high-speed devices. We demonstrate that this type of measurement can be carried out using an electro-optic sampling system[1] with a mode- locked injection laser as the source of sampling pulses. This source permits high repetition rate operation which is important for synchronizing the sampling laser to a fast circuit at a high clock rate. We describe measurements of very-high-speed long-wavelength photodiodes and of high repetition rate electrical waveforms. The system is also suitable for noninvasive characterization of high speed circuits based on III-V material technology. [2]

© 1986 Optical Society of America