Abstract

The development of high-speed electrical devices and circuits which operate in the picosecond range has stimulated a need for measurement techniques with correspondingly high temporal resolution. Optoelectronic sampling methods, in which psec on fsec laser pulses are used to interrogate the waveform on the test sample, have been developed for this purpose [1–3]. In this talk we describe a new approach in which sampling of electrical waveforms is achieved by spectral analysis of photoelectrons generated by ultrashort light pulses. Our technique is applicable to silicon based devices as well as to devices based on compound semiconductors.

© 1986 Optical Society of America