Abstract

Recently there has been much interest in broadband spectroscopy techniques based on optically generated ultrashort electromagnetic pulses.^1-3 Auston et. al. used Cherenkov-like radiation produced by optical rectification in non-linear crystals to perform contact reflection measurements.¹ We have demonstrated the Coherent Microwave Transient Spectroscopy (COMITS) technique to measure the complex dielectric properties of materials in the 15-130 GHz range.² More recently this technique has been extended to higher frequencies by Grischkowsky et. al.³ Here we present results of broadband microwave reflection spectroscopy with optoelectronically generated, freely propagating, picosecond transient radiation. The technique is illustrated with the measured complex reflection function of Fabry-Perot interferometers, the dispersion from amplitude gratings, and reflection from materials. The experimental results are compared with theory and in all cases very good agreement is found.

© 1990 Optical Society of America