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Characterization of a High-Intensity, Subpicosecond XeCl Laser System

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Abstract

In this talk we describe a fully characterized terawatt-class laser system based on the amplification of subpicosecond pulses in XeCl discharge amplifiers. Although several terawatt laser systems have been reported,16 complete characterization of the performance of these devices has not been made. Only for a few of these systems has the final output pulse width been determined, while measurements of the focal-spot diameter obtained upon focusing of the fully amplified beam have not been reported at all. Nevertheless, a firm knowledge of these parameters, especially the focal-spot diameter, is absolutely essential for the meaningful interpretation of experimental results. Given the extreme performance demanded of these systems, temporal and spatial distortion of the optical pulse should be the rule rather than the exception, making only indirect determinations of the final pulse width and beam quality unreliable. For these reasons, we have made a direct measurement of the output beam quality and carried out extensive measurements of the pulse width and spectrum throughout the entire optical train.

© 1990 Optical Society of America

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