Femtosecond Switching of the Solid-State Phase Transition in VO2

Michael F. Becker; A. Bruce Buckman; Rodger M. Walser; Thierry Lépine; Patrick Georges; Alain Brun

doi:10.1364/UP.1994.MD.17

Ultrafast Phenomena
Technical Digest Series (Optica Publishing Group, 1994),
paper MD.17
•https://doi.org/10.1364/UP.1994.MD.17

Femtosecond Switching of the Solid-State Phase Transition in VO₂

Michael F. Becker, A. Bruce Buckman, Rodger M. Walser, Thierry Lépine, Patrick Georges, and Alain Brun

International Conference on Ultrafast Phenomena 1994

California United States
2–6 May 1994
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Poster Session 1 (MD)

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M. F. Becker, A. B. Buckman, R. M. Walser, T. Lépine, P. Georges, and A. Brun, "Femtosecond Switching of the Solid-State Phase Transition in VO2," in Ultrafast Phenomena, Technical Digest Series (Optica Publishing Group, 1994), paper MD.17.

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Abstract

We have measured the transient change in the optical parameters of VO₂ thin films for laser excitation through the first-order phase transition near 68° C. Femtosecond laser excitation at 780 nm from an amplified, passively modelocked Ti:sapphire laser was used in a pulse-probe configuration to excite the VO₂ film through the semiconducting to metallic phase transition. The transient reflection and transmission were measured on a femtosecond and picosecond time range by a delayed probe pulse also at 780 nm. We have transformed the raw measurements of dynamic reflection and transmission to complex refractive index using a thin film model.

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