Impulsive excitation of LO phonons and induced transient refractive index change measurement.

D. P. Kien; O. Albert; J. Cl. Loulergue; J. Cl. Loulergue; J. Etchepare

doi:10.1364/UP.1994.ThD.26

Ultrafast Phenomena
Technical Digest Series (Optica Publishing Group, 1994),
paper ThD.26
•https://doi.org/10.1364/UP.1994.ThD.26

Impulsive excitation of LO phonons and induced transient refractive index change measurement.

D. P. Kien, O. Albert, J. Cl. Loulergue, and J. Etchepare

International Conference on Ultrafast Phenomena 1994

California United States
2–6 May 1994
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Poster Session 4 (ThD)

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D. P. Kien, O. Albert, J. C. Loulergue, and J. Etchepare, "Impulsive excitation of LO phonons and induced transient refractive index change measurement.," in Ultrafast Phenomena, Technical Digest Series (Optica Publishing Group, 1994), paper ThD.26.

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Abstract

We present a two-beam two-wavelength set-up which enables: (i) direct excitation of LO phonon(s), (ii) time resolved measurement of the resultant phase deformation by a far field analysis. This technique has been applied to the study of several ferroelectric crystals.

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