Femtosecond Time-Resolution in Scanning Tunneling Microscopy

G. Gerber; F. Sattler; S. Vogler; J.Y. Grand; P. Leiderer; R. Möller

doi:10.1364/UP.1994.TuD.19

Ultrafast Phenomena
Technical Digest Series (Optica Publishing Group, 1994),
paper TuD.19
•https://doi.org/10.1364/UP.1994.TuD.19

Femtosecond Time-Resolution in Scanning Tunneling Microscopy

G. Gerber, F. Sattler, S. Vogler, J.Y. Grand, P. Leiderer, and R. Möller

International Conference on Ultrafast Phenomena 1994

California United States
2–6 May 1994
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Poster Session 2 (TuD)

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G. Gerber, F. Sattler, S. Vogler, J. Y. Grand, P. Leiderer, and R. Möller, "Femtosecond Time-Resolution in Scanning Tunneling Microscopy," in Ultrafast Phenomena, Technical Digest Series (Optica Publishing Group, 1994), paper TuD.19.

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Abstract

Scanning tunneling microscopy (STM) allows to study surfaces with extremely high spatial resolution down to nanometer dimensions. This has changed the field of surface science. However, the time resolution of the STM is limited to the microsecond range due to the tunneling current measurement.

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