Brave New Nanoworld: Probing the Realm of Ultrafast, Ultrasmall Electronics

D.M. Bloom; A.S. Hou; F. Ho

doi:10.1364/UP.1994.WA.1

Ultrafast Phenomena
Technical Digest Series (Optica Publishing Group, 1994),
paper WA.1
•https://doi.org/10.1364/UP.1994.WA.1

Brave New Nanoworld: Probing the Realm of Ultrafast, Ultrasmall Electronics

D.M. Bloom, A.S. Hou, and F. Ho

International Conference on Ultrafast Phenomena 1994

California United States
2–6 May 1994
ISBN:

From the session
High Spatial and Temporal Resolution (WA)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
D. M. Bloom, A. S. Hou, and F. Ho, "Brave New Nanoworld: Probing the Realm of Ultrafast, Ultrasmall Electronics," in Ultrafast Phenomena, Technical Digest Series (Optica Publishing Group, 1994), paper WA.1.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

We have developed a new tool for measuring ultrafast voltages on integrated circuit devices. Our scanning force microscope probing system has 100-picosecond, submicron resolution and the ability to probe though passivating layers.

PDF Article

More Like This

Applications of Scanning Force Microscopy for Voltage Measurements with High Spatial and Temporal Resolutions

Francis Ho, A. Samson Hou, Bettina A. Nechay, David M. Bloom, and Edward L. Ginzton
JWA1 Quantum Optoelectronics (QOE) 1995

Scanning probe microscopy for testing ultrafast electronics

Alfred Samson Hou, Bettina Anne Nechay, Francis Ho, and David Michael Bloom
FP1 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 1995

Picosecond Electrical Sampling Using a Scanning Force Microscope

A. S. Hou, F. Ho, and D. M. Bloom
E4 Ultrafast Electronics and Optoelectronics (UEO) 1993

Previous Article Next Article