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Ultrafast Ellipsometry of Coherent Processes and Exciton-Exciton Interactions in Semiconductors

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Abstract

Ultrafast degenerate four-wave-mixing (FWM) techniques have been enormously successful in providing new information about coherent processes and excitonic effects in semiconductors. One of the techniques that has proven to be extremely powerful is to study the polarization dependence of the FWM process. Typically, these studies have addressed the dependence of the magnitude of the FWM signal (or its spectrum) on the incident polarizations, and there have been very few attempts to monitor the polarization state of the FWM signal itself. Moreover, the attempts that have been made have been restricted to measurements of the direction of polarization (ignoring the ellipticity and degree of polarization) and, therefore, they have not completely specified the polarization state of the emitted light. In addition, these measurements have been restricted to positive delays.

© 1996 Optical Society of America

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