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  • The Thirteenth International Conference on Ultrafast Phenomena
  • 2002 OSA Technical Digest Series (Optica Publishing Group, 2002),
  • paper ME16
  • https://doi.org/10.1364/UP.2002.ME16

Femtosecond Fluorescence Lifetimes Determined by an Intrinsic Raman Gate

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Abstract

A technique to record fluorescence lifetimes in the femtosecond regime which relies on the inverse Raman effect is presented. This technique allows to use a conventional pump-probe set-up for the lifetime measurement.

© 2002 Optical Society of America

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