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Ultrafast Dynamic Ellipsometry and Spectroscopies of Laser Shocked Materials

S. D. McGrane, C. A. Bolme, V. H. Whitley, and D. S. Moore

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Abstract

Ultrafast ellipsometry and transient absorption spectroscopies are used to measure material dynamics under extreme conditions of temperature, pressure, and volumetric compression induced by shock wave loading with a chirped, spectrally clipped shock drive pulse.

© 2010 Optical Society of America

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