Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

K. Fukumoto; K. Fukumoto; Y. Yamada; Y. Yamada; T. Matsuki; T. Matsuki; K. Onda; K. Onda; T. Noguchi; R. Mizokuchi; S. Oda; S. Koshihara; S. Koshihara

doi:10.1364/UP.2014.09.Wed.E.3

19th International Conference on Ultrafast Phenomena
OSA Technical Digest (online) (Optica Publishing Group, 2014),
paper 09.Wed.E.3
•https://doi.org/10.1364/UP.2014.09.Wed.E.3

Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy

K. Fukumoto, Y. Yamada, T. Matsuki, K. Onda, T. Noguchi, R. Mizokuchi, S. Oda, and S. Koshihara

International Conference on Ultrafast Phenomena 2014

Okinawa Japan
7–11 July 2014
ISBN: 1-55752-279-0

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Time-resolved Imaging (09.Wed.E)

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K. Fukumoto, Y. Yamada, T. Matsuki, K. Onda, T. Noguchi, R. Mizokuchi, S. Oda, and S. Koshihara, "Visualization of ultrafast electron dynamics using time-resolved photoemission electron microscopy," in 19th International Conference on Ultrafast Phenomena, OSA Technical Digest (online) (Optica Publishing Group, 2014), paper 09.Wed.E.3.

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Abstract

We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.

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