Scattering loss analysis in PMMA WGM micro resonator from surface irregularities

Robert Berķis; Kristians Draguns; Janis Alnis; Inga Brice; Aigars Atvars

doi:10.1364/AIS.2021.JTu5A.26

OSA Optical Sensors and Sensing Congress 2021 (AIS, FTS, HISE, SENSORS, ES)
OSA Technical Digest (Optica Publishing Group, 2021),
paper JTu5A.26
•https://doi.org/10.1364/AIS.2021.JTu5A.26

Scattering loss analysis in PMMA WGM micro resonator from surface irregularities

Robert Berķis, Kristians Draguns, Janis Alnis, Inga Brice, and Aigars Atvars

Applied Industrial Spectroscopy 2021

Washington, DC United States
19–23 July 2021
ISBN: 978-1-943580-90-3

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Joint Poster Session I (JTu5A)

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R. Berķis, K. Draguns, J. Alnis, I. Brice, and A. Atvars, "Scattering loss analysis in PMMA WGM micro resonator from surface irregularities," in OSA Optical Sensors and Sensing Congress 2021 (AIS, FTS, HISE, SENSORS, ES), S. Buckley, F. Vanier, S. Shi, K. Walker, I. Coddington, S. Paine, K. Lok Chan, W. Moses, S. Qian, P. Pellegrino, F. Vollmer, G. , J. Jágerská, R. Menzies, L. Emmenegger, and J. Westberg, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper JTu5A.26.

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Abstract

The following work shows new ways to analyze PMMA WGM micro resonators, that have irregularities, which acts as scattering centers. The scattering analyses could be used for integration into sensor systems and corrections of existing experiments.

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