Abstract
We demonstrate amorphization in a (GST) thin film through a nonthermal process by femtosecond electronic excitation. Amorphous recording marks were formed by irradiation with a single femtosecond pulse, and were confirmed to be recrystallized by laser thermal annealing. Scanning electron microscope observations revealed that amorphization occurred below the melting temperature. We performed femtosecond pump–probe measurements to investigate the amorphization dynamics of a GST thin film. We found that the reflectivity dropped abruptly within after excitation by a single pulse and that a small change in the reflectivity occurred within of this drop.
© 2010 Optical Society of America
Full Article | PDF ArticleMore Like This
Smriti Sahu, Rituraj Sharma, K. V. Adarsh, and Anbarasu Manivannan
Appl. Opt. 57(2) 178-184 (2018)
Pramod K. Khulbe, Xiaodong Xun, and M. Mansuripur
Appl. Opt. 39(14) 2359-2366 (2000)
Cheng Hung Chu, Chiun Da Shiue, Hsuen Wei Cheng, Ming Lun Tseng, Hai-Pang Chiang, Masud Mansuripur, and Din Ping Tsai
Opt. Express 18(17) 18383-18393 (2010)