Abstract

Electro-optic crystals, such as potassium tantalate niobate [${\mathrm{KTa}}_{1-x}{\mathrm{Nb}}_x{\mathrm{O}}_3$(KTN)], are enabling materials for many optical devices. Their utility in broadband applications heavily depends on their dispersion property. To this end, an analysis of dispersion mismatch in broadband optical interferometers is first presented. Then a method utilizing polynomial phase fitting to measure the dispersion property of materials composing the arms of an interferometer is introduced. As a demonstration, an interferometry system based on optical coherence tomography (OCT) was built, where, for the first time, the group velocity dispersion of a KTN crystal around 1310 nm was measured and numerically compensated for OCT imaging. Several advantages over a widely used method in OCT, which is based on metric functions, are discussed. The results show the fitting method can provide a more reliable measurement with reduced computation complexity.

© 2017 Optical Society of America

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