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Conferences > AOMS > 2020 > OTh4B > OTh4B.3

Focusing Through Scattering Materials Using Deep Neural Networks

Ivan Vishniakou and Johannes D. Seelig

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Abstract

Neural networks offer novel approaches for light control in microscopy. We compare different deep neural network architectures for focusing through scattering materials for applications in biological imaging.

© 2020 The Author(s)

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