Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Laser-Induced Focusing for Silicon nanoscopy

Not Accessible

Your library or personal account may give you access

Abstract

We demonstrate the shaping and focusing of a probe IR (λ=1.55μm) laser beam in silicon. The shaping was done by a second pump laser beam at λ=0.775μm and 30ps pulse width which simultaneously and collinearly, illuminates the silicon surface with the IR beam. The shaped probe beam will be used in silicon nanoscopy.

© 2020 The Author(s)

PDF Article
More Like This
Plasma Dispersion Induced Self-Focusing of a Vortex Laser Beam in Silicon

Nadav Shabairou, Zeev Zalevsky, and Moshe Sinvani
JM1B.4 Computational Optical Sensing and Imaging (COSI) 2023

Laser-Induced Tunable Focusing in Semiconductors

Nadav Shabairou, Zeev Zalevsky, and Moshe Sinvani
IW1C.4 Imaging Systems and Applications (IS) 2022

Sharper and Dipper Laser Beam Shaping for Super-Resolved Imaging in Silicon

Maor Tiferet, Zeev Zalevsky, and Moshe Sinvani
JTh3D.6 Computational Optical Sensing and Imaging (COSI) 2019

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved