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Freeform Optics Metrology Using Optical Coherence Tomography

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Abstract

We investigate the capability of a custom Fourier-domain swept-source optical coherence tomography method for non-contact freeform optics metrology. First results demonstrate the feasibility of measurement of an Alvarez surface with 400 µm sag.

© 2014 Optical Society of America

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More Like This
Scanning Customized Swept-source Optical Coherence Tomography (SS-OCT) for the Metrology of Freeform Optical Surfaces

Di Xu, Jianing Yao, Nan Zhao, and Jannick P. Rolland
FW5H.6 Frontiers in Optics (FiO) 2016

Metrology of Freeform Optics

Todd Blalock, Matt Brunelle, Ian Ferralli, and Brian Myer
JTh4B.1 Freeform Optics (Freeform) 2017

Nondestructive Metrology of Layered Polymeric GRIN Materials Using Optical Coherence Tomography

Jianing Yao, Panomsak Meemon, and Jannick P. Rolland
OTu4D.3 Optical Fabrication and Testing (OFT) 2012

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