Abstract

We present a quantitative phase microscopy method that uses a Bayer mosaic color camera to simultaneously acquire off-axis interferograms in transmission mode at two distinct wavelengths. Wrapped phase information is processed using a two-wavelength algorithm to extend the range of the optical path delay measurements that can be detected using a single temporal acquisition. We experimentally demonstrate this technique by acquiring the phase profiles of optically clear microstructures without $2\pi$ ambiguities. In addition, the phase noise contribution arising from spectral channel crosstalk on the color camera is quantified.

© 2010 Optical Society of America

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