Author Affiliations
Shun Notte,1
Sota Hashimoto,1
Tomoyoshi Inoue,1,2
Kenzo Nishio,3
Peng Xia,4
Sudheesh K. Rajput,1
Osamu Matoba,5
and Yasuhiro Awatsuji6,*
1Graduate School of Science and Technology, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan
2Japan Society for the Promotion of Science, Kojimachi Business Center Building, 5-3-1 Kojimachi, Chiyoda-ku, Tokyo 102-0083, Japan
3Advanced Technology Center, Kyoto Institute of Technology, Matsugasaki Goshokaido-Cho, Sakyo-ku, Kyoto 606-8585, Japan
4National Institute of Advanced Industrial Science and Technology (AIST), Central 2, 1-1-1 Umezono, Tsukuba 305-8568, Japan
5Kobe University, Organization for Advanced and Integrated Research, Rokkodai 1-1, Nada, Kobe 657-850, Japan
6Faculty of Electrical Engineering and Electronics, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto, 606-8585, Japan
*Corresponding author: awatsuji@kit.ac.jp