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Ellipsometric scatterometry for the metrology of sub-0.1-μm-linewidth structures

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Abstract

We describe a modification to our existing scatterometry technique for extracting the relative phase and amplitude of the electric field diffracted from a grating. This modification represents a novel combination of aspects of ellipsometry and scatterometry to provide improved sensitivity to small variations in the linewidth of subwavelength gratings compared with conventional scatterometer measurements. We present preliminary theoretical and experimental results that illustrate the possibility of the ellipsometric scatterometry technique providing a metrology tool for characterizing sub-0.1-μm-linewidth.

© 1998 Optical Society of America

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