Abstract
The two-modulator generalized ellipsometer has been used to measure samples in transmission. In this configuration, the instrument can completely characterize a linear diattenuator and retarder, measuring birefringence, diattenuation, the angle of the principal axis, and the sample depolarization simultaneously and accurately. This instrument can be operated in two modes: (1) spectroscopic, in which measurements are made through the entire sample aperture as a function of wavelength, and (2) spatially resolved, in which measurements are made at a single wavelength and a birefringence picture is made of the sample. Current spatially resolved measurements have been made at a resolution of ∼40 µm. Four samples have been examined with this instrument: (1) a mica plate, (2) a Polaroid polarizer, and (3) two quartz plates.
© 2002 Optical Society of America
Full Article | PDF ArticleMore Like This
Oriol Arteaga, Adolf Canillas, and Gerald E. Jellison, Jr.
Appl. Opt. 48(28) 5307-5317 (2009)
Gerald E. Jellison Jr., John D. Hunn, and Christopher M. Rouleau
Appl. Opt. 45(22) 5479-5488 (2006)
G. E. Jellison and F. A. Modine
Appl. Opt. 36(31) 8190-8198 (1997)