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Fourier ptychographic microscopy using an infrared-emitting hemispherical digital condenser

Abstract

Fourier ptychographic microscopy is demonstrated in the near-infrared spectral range using a computer-controlled hemispherical digital condenser comprising multiple 940 nm wavelength light emitting diodes. This technique was used to image periodic patterned samples (photonic crystals). Experimental and simulated results using a phase retrieval algorithm were found to be in excellent correspondence. We show that for samples with a single period in each direction, the resolution of the obtained high-resolution near-infrared images is limited by the Rayleigh criteria.

© 2016 Optical Society of America

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